Course: Computer and Numerical Methods in Metrology
Code: 3ФЕИТ03003
ECTS points: 6 ECTS
Number of classes per week: 3+0+0+3
Lecturer: Prof. Dr. Marija Chundeva – Blajer
Course Goals (acquired competencies): – Systematic understanding and improvement of methods of research connected to modeling and numerical calculation in metrology, – Understanding, design, application and adaptation of advanced models in metrology, – Crtical analysis, avaluation and synthesis of new complex models of measurement devices and systems.
Course Syllabus: Introduction in computer and numerical methods in metrology. Methods for analysis of measurement devices and their metrological characteristics. Modeling, identification and analysis of systems in metrology. Numerical methods in metrology. Method for analysis of non-linear phenomena in metrological devices and systems (method of finite differences, method of boundary elements, method of finite elements, hybrid methods). Static and dynamic analysis of metrological characteristics of measurement devices. Application of deterministic and stochastic optimization methods for metrological improvement and optimisation of measurement systems and devices.
Literature:
Required Literature |
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No. |
Author |
Title |
Publisher |
Year |
1 |
F. Pavese, A. B. Forbes | Data Modeling for Metrology and Testing in Measurement Science (Modeling and Simulation in Science, Engineering and Technology), | Birkhauser Boston, Springer Science+Business Media, LLC | 2009 |
2 |
F. Pavese, M. Bаer, J-R Filtz, A. B. Forbes, L. Pendrill, K. Shirono | Advanced Mathematical and Computational Tools in Metrology and Testing: AMCTM (Series on Advances in Mathematics for Applied Sciences) | World Scientific Publishing Co. Pte. Ltd. | 2012 |
3 |
A. Morris | Measurement and Instrumentation Principles | Butterworth-Heinemann Linacre House, Oxford | 2001 |
Additional Literature |
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No. |
Author |
Title |
Publisher |
Year |
1 |
J.Beyon | LabVIEW Programming, Data Acquisition and Analysis | Prentice Hall | 2001 |
2 |
G. Johnson R. Jennings | LabVIEW Graphical Programming | McGraw Hill | 2006 |