1. | Course Title | Computer and Numerical Methods in Metrology | |||||||||||
2. | Code | 4ФЕИТ03003 | |||||||||||
3. | Study program | 15-MMK | |||||||||||
4. | Organizer of the study program (unit, institute, department) | Faculty of Electrical Engineering and Information Technologies | |||||||||||
5. | Degree (first, second, third cycle) | Second cycle | |||||||||||
6. | Academic year/semester | I/1 | 7. | Number of ECTS credits | 6.00 | ||||||||
8. | Lecturer | Dr Marija Cundeva-Blajer | |||||||||||
9. | Course Prerequisites | ||||||||||||
10. | Course Goals (acquired competencies):
Systematic understanding and improvement of methods of research connected to modeling and numerical calculation in metrology, – Understanding, design, application and adaptation of advanced models in metrology, – Critical analysis, evaluation and synthesis of new complex models of measurement devices and systems. |
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11. | Course Syllabus:
Introduction in computer and numerical methods in metrology. Methods for analysis of measurement devices and their metrological characteristics. Modeling, identification and analysis of systems in metrology. Numerical methods in metrology. Method for analysis of non-linear phenomena in metrological devices and systems (method of finite differences, method of boundary elements, method of finite elements, hybrid methods). Static and dynamic analysis of metrological characteristics of measurement devices. Application of deterministic and stochastic optimization methods for metrological improvement and optimization of measurement systems and devices. |
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12. | Learning methods:
lectures, projects, case studies |
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13. | Total number of course hours | 180 | |||||||||||
14. | Distribution of course hours | 3 + 3 | |||||||||||
15. | Forms of teaching | 15.1 | Lectures-theoretical teaching | 45 hours | |||||||||
15.2 | Exercises (laboratory, practice classes), seminars, teamwork | 45 hours | |||||||||||
16. | Other course activities | 16.1 | Projects, seminar papers | 30 hours | |||||||||
16.2 | Individual tasks | 30 hours | |||||||||||
16.3 | Homework and self-learning | 30 hours | |||||||||||
17. | Grading | ||||||||||||
17.1 | Exams | 10 points | |||||||||||
17.2 | Seminar work/project (presentation: written and oral) | 30 points | |||||||||||
17.3. | Activity and participation | 10 points | |||||||||||
17.4. | Final exam | 50 points | |||||||||||
18. | Grading criteria (points) | up to 50 points | 5 (five) (F) | ||||||||||
from 51 to 60 points | 6 (six) (E) | ||||||||||||
from 61 to 70 points | 7 (seven) (D) | ||||||||||||
from 71 to 80 points | 8 (eight) (C) | ||||||||||||
from 81 to 90 points | 9 (nine) (B) | ||||||||||||
from 91 to 100 points | 10 (ten) (A) | ||||||||||||
19. | Conditions for acquiring teacher’s signature and for taking final exam | 60% success of all exam activites | |||||||||||
20. | Forms of assessment | Completed project work and oral presentation of the project | |||||||||||
21. | Language | Macedonian | |||||||||||
22. | Method of monitoring of teaching quality | Self-evaluation | |||||||||||
23. | Literature | ||||||||||||
23.1. | Required Literature | ||||||||||||
No. | Author | Title | Publisher | Year | |||||||||
1. | F. Pavese, A. B. Forbes | Data Modeling for Metrology and Testing in Measurement Science (Modeling and Simulation in Science, Engineering and Technology), | Birkhauser Boston, Springer Science+Business Media, LLC | 2009 | |||||||||
2. | F. Pavese, M. Bаer, J-R Filtz, A. B. Forbes, L. Pendrill, K. Shirono | Advanced Mathematical and Computational Tools in Metrology and Testing: AMCTM (Series on Advances in Mathematics for Applied Sciences) | World Scientific Publishing Co. Pte. Ltd. | 2012 | |||||||||
3. | A. Morris | Measurement and Instrumentation Principles | Butterworth-Heinemann Linacre House, Oxford | 2001 | |||||||||
23.2. | Additional Literature | ||||||||||||
No. | Author | Title | Publisher | Year | |||||||||
1. | J.Beyon | LabVIEW Programming, Data Acquisition and Analysis | Prentice Hall | 2001 |