| 1. | Course Title | Nanotechnologies, Nanometrology and Standardization | |||||||||||
| 2. | Code | 4ФЕИТ08013 | |||||||||||
| 3. | Study program | 15-MMK, 16-MNT | |||||||||||
| 4. | Organizer of the study program (unit, institute, department) | Faculty of Electrical Engineering and Information Technologies | |||||||||||
| 5. | Degree (first, second, third cycle) | Second cycle | |||||||||||
| 6. | Academic year/semester | I/1 | 7. | Number of ECTS credits | 6.00 | ||||||||
| 8. | Lecturer | Dr Hristina Spasevska | |||||||||||
| 9. | Course Prerequisites | ||||||||||||
| 10. | Course Goals (acquired competencies):
Gaining knowledge in the field of metrology of nanotechnologies, characterization of nanostructures and standardization with the aim of industrial production of nanoproducts. |
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| 11. | Course Syllabus:
Introduction to metrology of micro and nanotechnologies. Terminology and nomenclature in nanotechnologies. Metrological techniques for measuring nano values and limiting factors. Measurement of one-dimensional, two-dimensional and three-dimensional structures. Uncertainty in measuring nano dimensions. Metrological principles for industrial production of nano materials. Characterization and properties of nanomaterials. Application of nanomaterials for environmental protection. Impact of nanomaterials on the environment. Application of nanomaterials and nanostructures to obtain nanometrical systems for application in energy, electronics, robotics and automation. Standards in nanotechnologies, main areas of standardization in nanotechnologies. |
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| 12. | Learning methods:
Lectures, consultations, preparation of projects, presentations, independent study. |
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| 13. | Total number of course hours | 180 | |||||||||||
| 14. | Distribution of course hours | 3 + 3 | |||||||||||
| 15. | Forms of teaching | 15.1 | Lectures-theoretical teaching | 45 hours | |||||||||
| 15.2 | Exercises (laboratory, practice classes), seminars, teamwork | 45 hours | |||||||||||
| 16. | Other course activities | 16.1 | Projects, seminar papers | 30 hours | |||||||||
| 16.2 | Individual tasks | 30 hours | |||||||||||
| 16.3 | Homework and self-learning | 30 hours | |||||||||||
| 17. | Grading | ||||||||||||
| 17.1 | Exams | 30 points | |||||||||||
| 17.2 | Seminar work/project (presentation: written and oral) | 50 points | |||||||||||
| 17.3. | Activity and participation | 20 points | |||||||||||
| 17.4. | Final exam | 0 points | |||||||||||
| 18. | Grading criteria (points) | up to 50 points | 5 (five) (F) | ||||||||||
| from 51 to 60 points | 6 (six) (E) | ||||||||||||
| from 61 to 70 points | 7 (seven) (D) | ||||||||||||
| from 71 to 80 points | 8 (eight) (C) | ||||||||||||
| from 81 to 90 points | 9 (nine) (B) | ||||||||||||
| from 91 to 100 points | 10 (ten) (A) | ||||||||||||
| 19. | Conditions for acquiring teacher’s signature and for taking final exam | 60% success on all pre-exam activities | |||||||||||
| 20. | Forms of assessment | written and oral part | |||||||||||
| 21. | Language | Macedonian and English | |||||||||||
| 22. | Method of monitoring of teaching quality | Self-evaluation | |||||||||||
| 23. | Literature | ||||||||||||
| 23.1. | Required Literature | ||||||||||||
| No. | Author | Title | Publisher | Year | |||||||||
| 1. | Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, Marcel Van de Voorde | Metrology and Standardization for Nanotechnology | Wiley-VCH | 2017 | |||||||||
| 2. | Richard Leach | Fundamental Principles of Engineering Nanometrology | Elsevier | 2014 | |||||||||
| 3. | Vladimir Murashov, John Howard | Nanotechnology Standards | Springer | 2011 | |||||||||
| 23.2. | Additional Literature | ||||||||||||
| No. | Author | Title | Publisher | Year | |||||||||
| 1. | David J. Whitehouse | Handbook of Surface and Nanometrology | Taylor & Francis | 2010 | |||||||||
| 2. | Wei-Hong Zhong | Nanoscience and Nanomaterials: Synthesis, Manufacturing and Industry Impacts | DEStech Publications, Inc | 2012 | |||||||||
| 3. | Richard Leach | Fundamental Principles of Engineering Nanometrology | William Andrew | 2009 | |||||||||
